We are working on adding the manual and software,
password protected for SYSid users only.

Below is a list of the major differences between the last released version
6.1d and the current version 6.5d of SYSid.

1. Calibration
One of the biggest changes in this version is the introduction of simpler
calibration specification and measurements. It is now possible to specify
very simple calibration information, for example flat sensitivity and amp
gain, or specify complicated frequency dependent sensitivity and gain
(magnitude and angle) as a function of frequency. The accuracy of the
calibration depends on the validity of assumptions used to specify the
sensitivity and gain.

The calibration menu also allows measurement of transducer sensitivity and
gain as a function of frequency using a calibrator, reference microphone,
and adjustable gain amplifiers.

Some of the added functions are:
v  Measure the sensitivity of a transducer using a standard calibrator. Put
your mic into a calibrator and type in the calibrator output in dB SPL. Out
comes the mic sensitivity.
v  Calibration is now explicitly built into SYSid. It is now possible to
obtain a calibrated response simply by specifying the flat sensitivity of
the sensor and the gain of the amplifier. Alternatively it is possible to
specify the frequency dependent sensitivity from a file.
v  All measurements can be automatically normalized by the measured loop gain
stored in a file. Thus filtering effect of the DSP-16+ can be automatically
normalized. This functionality can be used to normalize the standard
response to obtain deviations from the standard (e.g., in the QC mode).
v  Check-Gain Function tells you both the maximum gain and amount of gain you
can increase your amplifier by.
v  Calculate total spectral energy (as in a sound level meter).
v  Calculate energy in 1/n_Octave bands (e.g., 1/3 Octave band SPL).

2. Frequency Domain
v  Multiply and divide by jw. Allows one to convert velocity measurements to
acceleration or displacement.
v  The 1/3 Octave smoothing function have been generalized to 1/n Octave
smoothing, where 2<n<50. The generalized 1/n Oct smoothing is available in
all sub modules (SYSqc, Impedance, etc.).
v  Improved inter-modulation distortion (can now specify ratio of voltages).

3. Distortion measurements
v  Convert data measured with log-frequency spaced tones to linear-frequency
spaced tones using cubic spline interpolation. Further processing from the
Process and mAth menus can now be performed on the primary level measured
from the distortion menu.
v  Plot data relative to the primary level in percent distortion.

4. Impedance measurements
v  The loading effect of the A/D converters is taken into account.
v  Improved Thiele-Small (small signal) speaker  parameters (including
high frequency Le, Re model).
v  Both the Delta-Mass and Delta-Compliance methods are available.
v  To verify the accuracy of the calculated Thiele-Small parameters, the
impedance is calculated from the parameters.

5. Quality Control
v  In addition to generating the upper & lower bound limit curves from the
statistical measurements of a given model it is possible to generate the
limit curves by shifting them by +/- dB amounts in up to ten frequency
bands.
v  The Criteria function can be set in up to ten different frequency bands.
Specify the number of points that can be above or below the upper and lower
boundaries, in each frequency band before rejecting the device under test.
v  Save and read back SYSqc parameters to and from a file (SYSQC.SAV).
v  In AutoSave and Test mode an <Esc> key prevents saving bad data to file
(during a Go/NoGo pause).
v  Repeat tests can be made by simply hitting the <SpaceBar> only.

6. Screen
v  Label y-axis according to the current units. For example, for the y-axis
can be labeled “Pascals” for calibrated pressure responses while for
vibration measurements it can be labeled “mm/sec.”