New Features Returning Features Quality Control Spectral Contamination Thiele-Small Parameters
SYSid Features
New Features in Version 6.5
  • Quality Control
  • Thiele-Small parameter measurement
  • New file formats (import and export)
  • Improved impedance measurements
  • 1/3 octave band smoothing
  • Returning Features
  • Log chirp joins chirp, MLS, tone, impulse and user-defined stimuli
  • RT60 measurements
  • 3-D waterfall displays
  • Reverse energy time curve
  • Continuous, octave or 1/3-octave
  • Editing of time waveform
  • Stereo 32,000 point FFTs for good low frequency resolution
  • Macros for automated operation
  • Extensive on-line help
  • MATLAB format supported
  • HP inkjets supported (color/mono)
  • 1/3 through 1/12 octave display
  • Quality Control
    A Quality Control module has been developed for SYSid. A system (speaker, electronics, etc.) is measured and the magnitude of the frequency response is compared against a pre-defined reference standard (e.g., +/- 3 dB from a mean value). SYSid will indicate a 'Pass' or 'Fail' result. The reference is defined by testing one or more products known to be good. The average of these good products' responses becomes the reference. Next, the user selects tolerance bands, in dB, above and below this reference. And finally, the user may permit a specified number (from zero on up) of data points to lie outside of the tolerance band. Data files are automatically numbered as they are acquired. After collecting a set of measurements, the mean and the standard deviation may be calculated with the statistics command. They can be used to determine the degree of 'statistical control' of the process.
    Spectral Contamination

    SYSid's spectral contamination measurement is a unique way to measure and quantify transducer clarity and definition in a subjectively meaningful way. For design engineers, spectral contamination tests using time domain averaging will reveal the true distortion contribution of each component (cone, spider, surround, magnetic system, etc) of a speaker system.

    Spectral contamination is a graphic analysis of cross-modulation products ('self-noise') produced by a system excited by a multi-frequency signal. Multi-tone tests are far more representative of the rigors of music or speech reproduction than traditional stimuli. The resulting non-linear distortion products (the noise between the tones, which are distortion products generated at frequencies where no excitation energy is present) correlates with subjective perceptions of quality, such as 'clarity' and 'coloration'. (See Spectral Contamination Measurement, by Deane Jensen and Gary Sokolich, AES preprint 2725, 85th AES Convention, 1988).

    By its nature, multi-tone testing elicits a lot of distortion products. Air pressure buildup behind the dustcap causing it to buckle and balloon, air whistling over leadout wires that are not firmly down on the collar, bobbin vent holes being submerged below the pole piece, flex leadout wires buzzing against the cones, surround resonances and many other anomalies can now be seen and quantified. The effectiveness of remedial measures may now be examined.

    Extracting valid data requires separation of the distortion signal, which looks like noise, form the ambient noise. This is particularly difficult when testing a transducer at low sound pressure levels. SYSid separates the response of the transducer under test from the ambient noise using time domain averaging. Sample spectral contamination plots of a typical stimulus, a mediocre speaker and a good speaker are on the last page.

    Spectral Contamination Tests
    At right is a sample spectral contamination stimulus containing 20 tones from 200 Hz to 800 Hz. Below are the results of testing premium and basic mid-bass drivers. The change in the height of the 20 tones is due to each speaker's linear frequency response. What looks like noise at the bottom of the plot, between the tones, are non-linear distortion products. The spectral contamination or 'self-noise'of the speaker in the middle is about 10 dB lower than that of the speaker on the bottom. The subjective difference is obvious: one sounds clean and clear, the other does not. Spectral contamination is a powerful tool for the design engineer, permitting him to quantify distortion in a subjectively meaningful way. Contamination
    Contamination Contamination
    Thiele-Small Parameters
    SYSid will determine the Thiele-Small parameters of speakers by first measuring the resonance in free air, and then in a sealed box of known volume. After these measurements, the user enters the diameter of the driver and the box volume, and SYSid calculates the T/S parameters.

    New Features
    Returning Features
    Quality Control
    Spectral Contamination
    Thiele-Small Parameters